Washington – The U.S. Department of Commerce’s United States Patent and Trademark Office (USPTO) will host a Patent Quality Community Symposium on Wednesday, April 27, 2016 at USPTO’s headquarters in Alexandria, Virginia and across the agency’s regional offices in Dallas, Denver, Detroit and Silicon Valley. The event will feature interactive segments and implementation updates on the Enhanced Patent Quality Initiative (EPQI).
WHAT:
Patent Quality Community Symposium
WHEN:
Wednesday, April 27 from 9:00 a.m. – 5:00 p.m. ET
WHERE:
Madison Auditorium (Alexandria location)
USPTO Campus
600 Dulany Street
Alexandria, VA 22314
The Patent Quality Community Symposium will update the public on various efforts that the USPTO is undertaking to enhance patent quality. In particular, the agency is pursuing eleven programs to improve clarity of the prosecution record, enhance examiner training, improve applicant-examiner interactions, and re-define ways to capture and measure data about quality. The symposium will feature lectures on these topics, an interactive workshop demonstration on how the Master Review Form will be applied, and a panel discussion with experienced patent practitioners about ways applicants can contribute to our efforts.
Agenda in Alexandria |
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Time (ET) | Topic | Speakers |
9:00-9:10 | Welcome | Valencia Martin Wallace, Deputy Commissioner for Patent Quality |
9:10-9:20 | Opening Remarks Before and After: How Is Enhanced Patent Quality Making a Difference |
Michelle Lee, Under Secretary of Commerce for Intellectual Property and Director of the USPTO |
9:20-10:00 | Search & Training Enhancements Highlights include: Global Dossier and Clarity of the Record Training |
Maria Holtmann, Director of International Programs Don Hajec, Assistant Deputy Commissioner for Patent Operations |
10:00-10:30 | Prosecution Enhancements Highlights include: Clarity of the Record Pilot |
Robin Evans, Director, Technology Center 2800 |
10:30-10:45 | MORNING BREAK | |
10:45-11:05 | Post-examination Enhancements Highlights include: Post Grant Outcomes |
Jack Harvey, Acting Assistant Deputy Commissioner for Patent Operations |
11:05-11:45 | Improving Evaluation of Examination Highlights include: Topic Submission for Case Studies and Big Data |
Brian Hanlon, Director of the Office of Patent Legal Administration |
11:45-12:45 | LUNCH BREAK (on your own) | |
12:45-1:00 | Quality Metrics Improving Patent Quality Measurement |
Marty Rater, Chief Statistician, Office of Patent Quality Assurance |
1:00-2:30 | Master Review Form (MRF) Hands-On Workshop Reviewing for Correctness, Clarity, and Consistency |
Sandie Spyrou, Supervisory Review Quality Assurance Specialist Kathleen Bragdon, Senior Advisor to the Deputy Commissioner for Patent Quality |
2:30-3:00 | MRF Report Out From the workshop |
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3:00-3:15 | AFTERNOON BREAK | |
3:15-4:15 | Panel Discussion How Applicants Can File and Prosecute a Quality Application |
|
4:15-4:50 | Q&A with Panel | Moderated by Russ Slifer, Deputy Under Secretary and Deputy Director |
4:50-5:00 | Closing Remarks USPTO’s Commitment to Quality |
Drew Hirshfeld, Commissioner for Patents |
For more information, including RSVP details, please visit: www.uspto.gov/patent/patent-
For non-press inquiries, please contact Jolyn Eley, (571) 272-2546 or email WorldClassPatentQuality@uspto.
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