Join the New York Intellectual Property Law Association (NYIPLA) on Thursday, November 15, 2018 for the One-Day Patent CLE Seminar to explore the latest issues and trends in intellectual property, all while earning 7 professional credits including diversity and implicit bias credit. Topics for the seminar include:

•What Patent Practitioners Need to Know About Ethically Handling Client’s Confidential Information in the Digital Age
•Arbitration of Patent Disputes
•Interactive Ethics CLE on Implicit Bias
•The Changing Interface between Administrative Proceedings and Patent Litigation
•Navigating Patent Strategies in View of Recent Developments in Section 101

Honorable Colleen McMahon, Chief United States District Judge, United States District Court for the Southern District of New York will give a keynote address.

Register online, https://www.nyipla.org/assnfe/ev.asp?ID=242.

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