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USPTO Symposium on Enhanced Patent Quality

April 27, 2016 @ 9:00 am - 5:00 pm EDT

| Free

USPTO is hosting a Symposium focused on Enhanced Patent Quality on Wednesday, April 27th from 9 am to 5 pm ET in the Madison Auditorium at the USPTO headquarters in Alexandria, VA. Please join us!

The purpose of the Symposium is to share an update about the USPTO’s programs to enhance patent quality. There also will be a hands on workshop to showcase new ways that the agency will measure patent quality and a panel discussion with experienced practitioners about how applicants can strengthen their application filings. A detailed program agenda, including speaker names and discussion topics, appears below.

The program is free and open to the public. The event will be webcast; please consult the USPTO’s Enhanced Patent Quality Initiative atwww.uspto.gov/patentquality for access information. To attend in person, please RSVP to patentquality@uspto.gov. Advance registration is not required to attend via webinar.

For more information, please visit USPTO’s Enhanced Patent Quality Initiative at www.uspto.gov/patentquality.

AGENDA

Q&A will be conducted after each agenda segment to collect participant feedback

Time (ET) Topic Speakers
9:00-9:10 Welcome Valencia Martin Wallace, Deputy Commissioner for Patent Quality
9:10-9:20 Opening Remarks Before and After: How Is Enhanced Patent Quality Making a Difference Michelle Lee, Under Secretary of Commerce for Intellectual Property and Director of the USPTO
9:20-10:00 Search & Training Enhancements Highlights include: Global Dossier and Clarity of the Record Training Maria Holtmann, Director of International Programs
Don Hajec, Assistant Deputy Commissioner for Patent Operations
10:00-10:30 Prosecution EnhancementsHighlights include: Clarity of the Record Pilot Robin Evans, Director, Technology Center 2800
10:30-10:45 MORNING BREAK
10:45-11:05 Post-examination Enhancements
Highlights include: Post Grant Outcomes
Jack Harvey, Acting Assistant Deputy Commissioner for Patent Operations
11:05-11:45 Improving Evaluation of Examination Highlights include: Topic Submission for Case Studies and Big Data Brian Hanlon, Director of the Office of Patent Legal Administration
11:45-12:45 LUNCH BREAK (on your own)
12:45-1:00 Quality Metrics Improving Patent Quality Measurement Marty Rater, Chief Statistician
1:00-2:30 Master Review Form (MRF) Hands-On Workshop Reviewing for Correctness, Clarity, and Consistency Sandie Spyrou, Supervisory Review Quality Assurance Specialist
Kathleen Bragdon, Senior Advisor to the Deputy Commissioner for Patent Quality
2:30-3:00 MRF Report Out From the workshop Sandie Spyrou, Supervisory Review Quality Assurance Specialist
Kathleen Bragdon, Senior Advisor to the Deputy Commissioner for Patent Quality
3:00-3:15 NETWORKING BREAK
3:15-4:15 Panel Discussion How Applicants Can File and Prosecute a Quality Application Russ Slifer, Deputy Under Secretary of Commerce for Intellectual Property and Deputy Director of the USPTO
Bill Bunker, Knobbe Marten
Rick Nydegger, Workman Nydegger
Kevin Noonan, MBHB
Laura Sheridan, Google
Tim Wilson, SAS
4:15-4:50 Q&A with Panel Moderated by Russ Slifer, Deputy Under Secretary and Deputy Director
4:50-5:00 Closing Remarks USPTO’s Commitment to Quality Drew Hirshfeld, Commissioner for Patents

 

Speakers

Valencia Martin-Wallace

Deputy Commissioner for Patent Quality

Michelle K. Lee

Under Secretary of Commerce for Intellectual Property and Director of the United States Patent and Trademark Office (USPTO)

Russell Slifer

Former Deputy Director of the United States Patent and Trademark Office

Drew Hirshfeld

Commissioner for Patents, USPTO

Details

Date:
April 27, 2016
Time:
9:00 am - 5:00 pm
Cost:
Free
Event Category:

Venue

USPTO – Madison Auditorium
600 Dulany Street
Alexandria, VA 22314 United States
+ Google Map
Phone:
(571) 272-8400
Website:
http://www.uspto.gov/